Journal Article Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements Get access Zhong Lin (ZL) Wang Zhong Lin (ZL) Wang Center for Nanoscience and Nanotechnology, and School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245, e-mail: zhong.wang@mse.gatech.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 300–301, https://doi.org/10.1017/S1431927602100821 Published: 01 November 2002
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