Phonon Scattering in Quantitative High-Resolution Electron Microscopy – effects, problems and approaches

Journal Article Phonon Scattering in Quantitative High-Resolution Electron Microscopy – effects, problems and approaches Get access Zhong Lin (ZL) Wang Zhong Lin (ZL) Wang School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245 USA E-mail: zhong.wang@mse.gatech.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1602–1603, https://doi.org/10.1017/S1431927602104594 Published: 01 August 2002