Nanobelt Thickness and Mean-free Path Determination by CBED and PEELS

Journal Article Nanobelt Thickness and Mean-free Path Determination by CBED and PEELS Get access Y Berta, Y Berta School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245 Search for other works by this author on: Oxford Academic Google Scholar C Ma, C Ma School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245 Search for other works by this author on: Oxford Academic Google Scholar ZL Wang ZL Wang School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332-0245 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1608–1609, https://doi.org/10.1017/S1431927602104624 Published: 01 August 2002