Nanoscale Characterization of CDC Supercapacitors by In Situ Scanning Probe Microscopy Methods

Patrick M. Winter, Gregory M. Lanza, Samuel A. Wickline, Marc Madou, Chunlei Wang, Parag B. Deotare, Marko Lončar, Yoke Khin Yap, Jérôme Rose, Mélanie Auffan, Olivier Proux, Vincent Nivière, Jean‐Yves Bottero, Zhong Lin Wang, Ying Liu, Ronald G. Polcawich, J. S. Pulskamp, R. M. Proie, Woo-Tae Park, Sergei V. Kalinin, Brian J. Rodriguez, Andréi L. Kholkin, Gang Logan Liu, Jao van de Lagemaat,

Article2005

In-situ Heating Electron Microscopy on Cu/SnO2 Bilayer Nanoribbons

X F Zhang, Matt Law, Rong Yu, Tevye Kuykendall, Peidong Yang

Nanoscale Characterization of CDC Supercapacitors by In Situ Scanning Probe Microscopy Methods

Abstract

Discussion(0)

Related publications

Scanning Probe Microscopy Studies of Carbon Nanotubes

Scanning Probe Microscopy in TEM : an In-situ Approach for Nano-scale Property Measurements

Melting and crystallization behavior of metallo-supramolecular polymers studied by scanning probe microscopy techniques

Probe Technology of Scanning Probe Microscopy (SPM) and Its Fabrication Technology

In-situ Heating Electron Microscopy on Cu/SnO2 Bilayer Nanoribbons