Probe Technology of Scanning Probe Microscopy (SPM) and Its Fabrication Technology

Patrick M. Winter; Gregory M. Lanza; Samuel A. Wickline; Marc Madou; Chunlei Wang; Parag B. Deotare; Marko Lončar; Yoke Khin Yap; Jérôme Rose; Mélanie Auffan; Olivier Proux; Vincent Nivière; Jean‐Yves Bottero; Zhong Lin Wang; Ying Liu; Ronald G. Polcawich; J. S. Pulskamp; R. M. Proie; Woo-Tae Park; Sergei V. Kalinin; Brian J. Rodriguez; Andréi L. Kholkin; Gang Logan Liu; Jao van de Lagemaat; Lorenzo Valdevit; John W. Hutchinson; Seajin Oh; Marc Madou; Katja Tonisch; Enrica De Rosa; Joseph Fernandez‐Moure; Ennio Tasciotti; Denis Gebauer; Brian E. O’Neill; King C. Li

doi:10.1007/978-90-481-9751-4_100680

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