In-situ analysis by AFM, ellipsometry and electrochemical multisine impedance spectroscopy of the ultrathin organic deposition of n-octylphosphonic acids on aluminium oxides — Tom Hauffman (2009) | RDL Network
In-situ analysis by AFM, ellipsometry and electrochemical multisine impedance spectroscopy of the ultrathin organic deposition of n-octylphosphonic acids on aluminium oxides
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