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Characterisation of the structure of thin silane layers on aluminium by coupling electrochemical impedance spectroscopy and ellipsometry — Christophe Le Pen (2002) | RDL Network
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Characterisation of the structure of thin silane layers on aluminium by coupling electrochemical impedance spectroscopy and ellipsometry
HT
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Herman Terryn
Vrije Universiteit Brussel
Characterisation of the structure of thin silane layers on aluminium by coupling electrochemical impedance spectroscopy and ellipsometry
Article
2002
English
Authors
+1 more
CP
Christophe Le Pen
AF
Alexis Franquet
HT
Herman Terryn
Vrije Universiteit Brussel
Abstract
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