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Study of organic self-assembling monolayers on aluminium oxides by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS) — Tom Hauffman (2007) | RDL Network
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Study of organic self-assembling monolayers on aluminium oxides by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)
HT
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Herman Terryn
Vrije Universiteit Brussel
Study of organic self-assembling monolayers on aluminium oxides by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS)
Article
2007
English
Authors
+3 more
TH
Tom Hauffman
OB
Orlin Blajiev
JS
J. Snauwaert
Abstract
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