493 publications from this institution
Abstract For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x‐ray photoelectron diffraction (XPED) patterns from single‐molecule adsorbing surfaces by using both Cr Lα (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward‐scattering peaks and Kikuchi‐like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr Lα were more diffuse. However, the circular patterns excited by Cr Lα are clearer than those excited by Al Kα. This result suggests that the use of a lower energy x‐ray source improves XPED structural analysis on ultrathin films composed of light elements. Copyright © 2004 John Wiley & Sons, Ltd.
Studies on chemical behavior of energetic deuterium implanted into SiC, Si, and graphite were carried out by means of the X-ray photoelectron spectroscopy (XPS) and the thermal desorption spectroscopy (TDS). Two chemical states of implanted deuterium were observed in SiC. It was suggested that the one was contribution of deuterium in interstitial, and the other was contribution of deuterium in defects resulted by deuterium ion (D2+) implantation. From the results for Si, it was found that implanted deuterium existed in Si with three chemical states. The deuterium behavior in graphite was different with that in SiC and in Si. The deuterium chemical behavior in SiC was discussed in comparison with that implanted into Si and graphite.