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The adhesion at interfaces between dissimilar materials is strongly affected by both segregation and the extent of plasticity in the adjoining material, particularly when one of these is a metal (or thermoplastic). It will be shown that these interfaces when clean, are generally strong and tough, such that failure occurs in one of the adjoining materials, rather than at the interface. However, segregrants and contaminants often embrittle and weaken the interface, especially in combination with ambient moisture. The embrittlement is obviated either by alloying with elements that “getter” the contaminants or by using an “adhesion layer” that has essentially the same effect: Cr and Ti are particularly effective gettering elements. Models that relate these effects to fundamental material parameters through non-dimensional indices are described. They comprise linkages between atomistic and continuum, enabled by implementation of a plasticity length scale, within the context of a crack growth simulation routine. Comparison with the experimental results is conducted, leading to suggestions for development of a predictive scheme.
Obituary| January 01 2016 Ethan Andrew Schmidt, 1975–2015 Robbie Ethridge; Robbie Ethridge Search for other works by this author on: This Site Google James Rice James Rice Search for other works by this author on: This Site Google Ethnohistory (2016) 63 (1): 167–169. https://doi.org/10.1215/00141801-3443867 Cite Icon Cite Share Icon Share Facebook Twitter LinkedIn MailTo Permissions Search Site Citation Robbie Ethridge, James Rice; Ethan Andrew Schmidt, 1975–2015. Ethnohistory 1 January 2016; 63 (1): 167–169. doi: https://doi.org/10.1215/00141801-3443867 Download citation file: Zotero Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search Books & JournalsAll JournalsEthnohistory Search Advanced Search The text of this article is only available as a PDF. Copyright 2016 by American Society for Ethnohistory2016 Article PDF first page preview Close Modal You do not currently have access to this content.
This paper describes a technique to measure the surface density of the defects in self-assembled monolayers (SAMs) of hexadecanethiolates on gold that lead to etching of the gold when the system is etched with aqueous ferricyanide solution. This technique uses two steps of amplification through chemical reaction to convert pinhole defects in SAMs into easily imaged, micron-scale pits in an underlying Si support. With this technique, it is possible to evaluate the density of defects in SAMs and in the structures prepared by using SAMs as resists under conditions that may be encountered in lithographic processing. At present, the lowest density of pits that we have measured for SAMs of hexadecanethiolates on 50 nm thick gold is ∼5 pits/mm2. This density is an upper limit for the density of defects that expose bare gold to the etching solution or that comprise regions of SAM sufficiently thin that the SAM is not able to block access of the etchant to the gold.