Skip to content
RDL
Network
Ecosystem
Switch app
TR
About
FAQ
Sign in
Get started
Uncertainty due to limited sampling of circular features on coordinate measuring machines — Nick Van Gestel (2007) | RDL Network
Back
Cite
Save
Save for later
Share
Home
Publications
Uncertainty due to limited sampling of circular features on coordinate measuring machines
Shared by
Jean-pierre Kruth
KU Leuven
Uncertainty due to limited sampling of circular features on coordinate measuring machines
Article
2007
English
Authors
+1 more
NG
Nick Van Gestel
SC
Steven Cuypers
Jean-pierre Kruth
Ku Leuven
Abstract
1 min read
No abstract is provided for this article.
Discussion
(0)
Sign in
to like and join the discussion.
No comments yet. Be the first to comment.
Related publications
Article
2007
Uncertainty due to limited sampling of circular features on coordinate measuring machines
Nick Van Gestel
,
Steven Cuypers
,
Jean-pierre Kruth
,
Philip Bleys
Article
2005
Study of the disturbance influences on optical coordinate measuring machines
Pieter-Jan Corthouts
,
Nick Van Gestel
,
Philip Bleys
,
Jean-pierre Kruth
Article
1994
Mathematical aspects of three-dimensional coordinate measuring machines: measuring and modelling free-form surfaces
Pol Verstraelen
,
Jean-pierre Kruth
,
Michel Janssens
Article
2001
A quick-check artefact and procedure for coordinate measuring machines
Christophe Van Den Bergh
,
Jean-pierre Kruth
,
Paul Vanherck
Article
1992
CAD modeling of sculptured surfaces from digitized data of coordinate measuring machines
Jean-pierre Kruth
,
Whe Ma
Discussion(0)
No comments yet. Be the first to comment.