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Uncertainty due to limited sampling of circular features on coordinate measuring machines — Nick Van Gestel (2007) | RDL Network
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Uncertainty due to limited sampling of circular features on coordinate measuring machines
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Jean-pierre Kruth
KU Leuven
Uncertainty due to limited sampling of circular features on coordinate measuring machines
Article
2007
en
Authors
+1 more
NG
Nick Van Gestel
SC
Steven Cuypers
Jean-pierre Kruth
Ku Leuven
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