Two-dimensional finite-element simulation of the piezo-phototronic effect in p–n-junction-based devices is carried out for the first time. A charge channel can be induced at the p–n junction interface when strain is applied, given the n-side is a piezoelectric semiconductor and the p-type side is non-piezoelectric semiconductor. This provides the first simulated evidence supporting the previously suggested mechanism responsible for the experimentally observed gigantic change of light-emission efficiency in piezo-phototronic light-emitting devices. As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
Yusheng Zhou, Ronan Hinchet, Ya Yang, Gustavo Ardila, Rudeesun Songmuang, Fang Zhang, Yan Zhang, Weihua Han, Ken C. Pradel, L. Montès, Mireille Mouis, Zhong Lin Wang
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