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Spreading Resistance Profiling Study of GeSi/Si Structures by High Dose Ge Implantation into Si — W.Y. Cheung (1994) | RDL Network
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Spreading Resistance Profiling Study of GeSi/Si Structures by High Dose Ge Implantation into Si
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Paul Kim Ho Chu
Spreading Resistance Profiling Study of GeSi/Si Structures by High Dose Ge Implantation into Si
Article
1994
en
Authors
+2 more
WC
W.Y. Cheung
SW
S. P. Wong
IW
I. H. Wilson
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