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Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique — S. Banerjee (2004) | RDL Network
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Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique
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Daniel Chateigner
Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique
Article
2004
en
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SB
S. Banerjee
SF
S. Ferrari
DC
Daniel Chateigner
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