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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis — Luca Lutterotti (2004) | RDL Network
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Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
DC
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Daniel Chateigner
Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
Article
2004
en
Authors
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LL
Luca Lutterotti
DC
Daniel Chateigner
SF
S. Ferrari
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