[EN] The occurrence of preferred crystallographic orientations, or texture, is a determinant factor of the behaviour of polar materials, \nlike ferroelectric thin films. This is the reason why numerous works have been focused in the preparation of highly oriented \nfilms for pyroelectric sensors and electromechanical applications. Traditionally, preferred orientations were determined by \nthe analysis of the main reflections obtained by X-ray diffraction, which only in some cases are characteristic of the texture of \nthe material. Regardless of the interest of this subject, the quantitative texture analysis of ferroelectric thin films has not been \nsystematically applied. This consists in the measurement of pole figures with a goniometer, and the determination of the orientation \ndistribution function. In this work we summarise briefly the principles of the quantitative texture analysis and we \ndemonstrate its application to the study of different ferroelectric thin films: La and Ca modified lead titanate (PTL and PTC) \nand lead zirconate titanate (PZT). This method allows the study of the characteristics of the type of texture and the identification \nof the different components that contribute to the final texture of the material. An indicative value of the texture strength \nis also obtained for both the ferroelectric film and the substrate layers. This information allows us the study of the process that \nleads to the orientation in thin films, and to obtain correlations between texture and physical properties.
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