Preferential orientation of ferroelectric calcium modified lead titanate thin films grown on various substrates

[EN] Among all the factors that determine the development of preferential orientation or texture in polycrystalline thin films, the
\nmost important is the nature of the substrate. A preferential orientation of the crystallites with the polar axis perpendicular
\nto the film surface results in an important improvement of the ferroelectric behaviour. In the search for the substrate that
\nproduces highly oriented ferroelectric thin films, this work analyses by quantitative texture analysis calcium modified lead
\ntitanate thin films deposited on platinised Si, MgO and SrTiO3 substrates. Amixed preferential orientation along <100> and
\n<001> is obtained. From the results of this study we discuss the factors that contribute to the different final textures. First, we
\nanalyse the different texture strength of the Pt layer observed in the three substrates, and the growth of the ferroelectric film
\non them, whose orientation seems to develop independently of the Pt in this case. And secondly, we study the effect of the
\nstress developed during the crystallisation process, caused by the difference in thermal expansion coefficient between each
\nof the substrates and the film, especially on the domain structure formation at the paraelectric cubic- ferroelectric tetragonal
\nphase transition.