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On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition (2018) | RDL Network
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On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
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Frede Blaabjerg
Aalborg University
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Article
2018
en
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