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Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules (2017) | RDL Network
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Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules
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Frede Blaabjerg
Aalborg University
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules
Article
2017
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