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Measuring the Young's modulus of solid nanowires by in situ TEM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science) — Zhong Lin Wang (2002) | RDL Network
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Measuring the Young's modulus of solid nanowires by in situ TEM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
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Zhong Lin Wang
Beijing Institute of Technology
Measuring the Young's modulus of solid nanowires by in situ TEM (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
Article
2002
en
Authors
Zhong Lin Wang
Beijing Institute of Technology
ZD
Z. R. Dai
RG
Ruiping Gao
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