Effect of capping on the Dirac semimetal Cd<sub>3</sub>As<sub>2</sub> on Si grown via molecular beam epitaxy
Article 2025 en
Authors
WL
Wei‐Chen Lin
CC
Chiashain Chuang
CK
Chun-Wei Kuo
Abstract
1 min read
Given the promising applications of large magnetoresistance in the Dirac semimetal cadmium arsenide (Cd<sub>3</sub>As<sub>2</sub>), extensive research into Si-compatible Cd<sub>3</sub>As<sub>2</sub>devices is highly desirable. To prevent surface degradation and oxidation, the implementation of a protection layer on Cd<sub>3</sub>As<sub>2</sub>is imperative. In this study, two vastly different protecting layers were prepared on top of two Cd<sub>3</sub>As<sub>2</sub>samples. A zinc telluride layer was grown on top of one Cd<sub>3</sub>As<sub>2</sub>film, giving rise to a ten-fold increased mobility, compared to that of the pristine Cd<sub>3</sub>As<sub>2</sub>sample. Interestingly, unusual negative magnetoresistance is observed in the hexagonal boron nitride-capped Cd<sub>3</sub>As<sub>2</sub>device when a magnetic field is applied perpendicularly to the Cd<sub>3</sub>As<sub>2</sub>plane. This is in sharp contrast to the chiral anomaly that requires a magnetic field parallel to the Cd<sub>3</sub>As<sub>2</sub>plane. We suggest that a protection layer on molecular beam epitaxy-grown Cd<sub>3</sub>As<sub>2</sub>should be useful for realising its great device applications in magnetic sensing.
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