Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging

Journal Article Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging Get access Jane Howe, Jane Howe Hitachi High-Technologies Canada Inc, Toronto, Canada Search for other works by this author on: Oxford Academic Google Scholar Yoichiro Hashimoto, Yoichiro Hashimoto Science System Design Division, Hitachi High-Technologies Co., Hitachinaka, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Xue Wang, Xue Wang The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA Search for other works by this author on: Oxford Academic Google Scholar Madeline Vara, Madeline Vara The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA Search for other works by this author on: Oxford Academic Google Scholar David Hoyle, David Hoyle Hitachi High-Technologies Canada Inc, Toronto, Canada Search for other works by this author on: Oxford Academic Google Scholar Tom Schamp, Tom Schamp Hitachi High-Technologies America Inc, Gaithersburg, USA Search for other works by this author on: Oxford Academic Google Scholar Younan Xia, Younan Xia The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA Search for other works by this author on: Oxford Academic Google Scholar David Joy David Joy Department of Materials Science and Engineering, University of Tennessee, Knoxville, USACenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1265–1266, https://doi.org/10.1017/S1431927615007114 Published: 23 September 2015