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Combined analysis in 2015: XRD (texture, residual stresses, microstructure) complemented by fluorescence (XRF and GiXRF) and electron diffraction — Daniel Chateigner (2015) | RDL Network
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Combined analysis in 2015: XRD (texture, residual stresses, microstructure) complemented by fluorescence (XRF and GiXRF) and electron diffraction
DC
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Daniel Chateigner
Combined analysis in 2015: XRD (texture, residual stresses, microstructure) complemented by fluorescence (XRF and GiXRF) and electron diffraction
Article
2015
en
Authors
+5 more
DC
Daniel Chateigner
LL
Luca Lutterotti
BC
B. Caby
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