An electron diffraction determination of the molecular structures of perchlorodisiloxane and methoxytrifluorosilane

The molecular structures of (Cl3Si)2O and F3SiOCH3 have been determined in the vapour phase by the sector microphotometer method of electron diffraction. For (Cl3Si)2O a C2 model with an “ angle of twist ” of 29° is preferred.