An advanced measurement system for verification of models and datasheets

This paper describes an advanced measurement system for power electronic semiconductor devices. The measurement system is both used for characterization of devices and for determination of model-parameters in device models. The hardware in the system is described and can handle 1200 V/300 A. The measurement system has connection to simulation software such as SABER and PSPICE. Different single device measurement circuits are specified as well as different parameters can be extracted from each measurement. A PC controls the instruments and special menu-oriented software is developed. The software structure is described. Measurement examples on IGBT, diode and MCT are shown as well as extended measurements are presented like switching losses for different load currents. Finally, an example of a parameter extraction for a diode model is done where simulations in SABER and measurements are compared. It is concluded simulations and measurements agree well and the measurement system is a strong tool for further investigation of power semiconductor devices.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>