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In this paper a brief introduction to hybrid intelligent systems is presented. Hybrid intelligent systems can be developed by a suitable combination of soft computing methodologies. In particular, the applications of hybrid intelligent systems to pattern recognition and intelligent manufacturing are briefly described. The importance of designing and implementing hybrid intelligent systems for real-world applications is highlighted.
In this paper, we present a technique to enhance transition delay and stuck-open fault testing in an LSSD environment. To reduce shift dependency in the scan path, thereby improving transition quality, a re-arrangement heuristic combined with a one level XOR network is proposed. The method is hierarchical, combining a simple re-arrangement, heuristic driven local reconfiguration, and finally a circuit modification to improve delay fault testing.