Tracking Lithiation with Advanced Transmission Electron Microscopy

Journal Article Tracking Lithiation with Advanced Transmission Electron Microscopy Get access Xincheng Lei, Xincheng Lei Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, China Search for other works by this author on: Oxford Academic Google Scholar Jiayi Wang, Jiayi Wang Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, ChinaSchool of Information and Optoelectronic Science and Engineering & International Academy of Optoelectronics at Zhaoqing, South China Normal University, Guangzhou, China Search for other works by this author on: Oxford Academic Google Scholar Xuefeng Wang, Xuefeng Wang Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, China Search for other works by this author on: Oxford Academic Google Scholar Lin Gu, Lin Gu Beijing National Center for Electron Microscopy and Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University,Beijing, China Search for other works by this author on: Oxford Academic Google Scholar Dong Su Dong Su Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, ChinaUniversity of Chinese Academy of Sciences, Beijing, China Corresponding author: dongsu@iphy.ac.cn Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1740–1741, https://doi.org/10.1093/micmic/ozad067.900 Published: 22 July 2023