David M. Hiemstra; Valeri Kirischian; Duu‐Jong Lee; Michael Wirthlin; G.M. Swift; Anh T. Le; Nadia Rezzak; Junjun Wang; Chen‐Fen Huang; Vincent Nguyen; Gert‐Jan Bakker; Heather Quinn; Tom Fairbanks; Jeffrey W. Tripp; G Duran; Beatriz López; Leon ft; Microprocessor Hafer; S. M. Guertin; Brian Baranski; Geraldine Butler; John D. Nagy; S. Griffith; Alexander Jordan; Carsten Hafer; J. Mabra; C. Mnich; Mitch Leslie; Mehran Amrbar; Michael J. Tostanoski; Terrence F. Deaton; Richard F. Strayer; R. Goldflam; Travis Z. Fullem; F. Villa; Maud Baylac; Solenne Rey; O. Rossetto; Walid Mansour; Pilar Ramos; Raoul Velazco; G Altitude; Douglas M. Lambert; Francois Desnoyers; Didier Thouvenot; B. Azaïs; Alex Lidow; Akinori Nakata; Matt Rearwin; Johan Strydom; A. M. Zafrani; Kirby Kruckmeyer; Thang Trinh; Nicolaas van Vonno; Bryan R.G. Williams; S. D. Turner; Elizabeth Thomson; Serge Bernard; D. N. Goodhew; Bicmos Parts; J. E. Shick; P. W. Traynham; F Ballou; Jagbir Gill; Zhiqiang Wang; Xiao Zhang; Bing He; Sunan Huang; Ben Zhong Tang; Ming Liu; David E. Thompson; B. Fodness; Peter Lee; S. Gissot; A. Benmoussa; B. Giordanengo; Ali Soltani; Takanori Saito; U. Schuehle; U. Kroth; Alexander Gottwald; Jocelyne Césari; Daniel R. Gomez; María Roca; E. Isern; A. Morelos Pineda; E. Garcı́a-Moreno; Leonardo Rojas; Tom Clatworthy; Magdalena Skipper; Muhsiung Chang; Nick Nelms; Abelardo Pérez Albiñana; Florence Malou; Gilles Gasiot; Romain Chevallier; L. Dugoujon; P. Roche; А. Н. Новиков; Alexander Pechenkin

doi:10.1109/redw.2014.7004507

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Table of contents — David M. Hiemstra (2014) | RDL Network

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Ben Zhong Tang

Article 2014 en

Authors

DH
David M. Hiemstra
VK
Valeri Kirischian
DL
Duu‐Jong Lee

Abstract

1 min read

The following topics are dealt with: total ionizing dose; radiation hardening; FPGA; SRAM; microprocessor; single event effect; power MOSFET; CMOS technology; DC-DC converter; microwave ICs; and single event transient.

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Publication Info

DOI: 10.1109/redw.2014.7004507
Year: 2014
Published: —
Language: en

Article Details

Link Of The Paper: https://doi.org/10.1109/redw.2014.7004507

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Created:June 19, 2026

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