The following topics are dealt with: total ionizing dose; radiation hardening; FPGA; SRAM; microprocessor; single event effect; power MOSFET; CMOS technology; DC-DC converter; microwave ICs; and single event transient.

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Publication Info

DOI: 10.1109/redw.2014.7004507
Year: 2014
Published: —
Language: en

Article Details

Link Of The Paper: https://doi.org/10.1109/redw.2014.7004507

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Created:June 19, 2026

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