Scanning tunnelling microscopy of suspended graphene

Recep Zan; C.A. Muryn; U. Bangert; Philip Mattocks; P.L. Wincott; David Vaughan; Xuesong Li; Luigi Colombo; Rodney S. Ruoff; Bruce Hamilton; Konstantin ‘kostya’ Novoselov

doi:10.1039/c2nr30162h

Scanning tunnelling microscopy of suspended graphene

Nanoscale 4(10): 3065-3065

Article 2012 English

Abstract

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Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

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