SCANNING TUNNELING MICROSCOPY

RETURN TO ISSUEPREVNewsNEXTSCANNING TUNNELING MICROSCOPYSurface-sensitive technique is providing insights into structure and electronic properties of bulk material in low-dimensional solidsCHARLES M. LIEBERView Author Information Harvard UniversityCite this: Chem. Eng. News 1994, 72, 16, 28–44Publication Date (Print):April 18, 1994Publication History Published online11 November 2010Published inissue 18 April 1994https://pubs.acs.org/doi/10.1021/cen-v072n016.p028https://doi.org/10.1021/cen-v072n016.p028newsACS PublicationsCopyright © 1994 AMERICAN CHEMICAL SOCIETYArticle Views13Altmetric-Citations7LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access options SUBJECTS:Materials science,Rational design,Scanning tunneling microscopy Get e-Alerts