Risk factors for the development of incident atrial fibrillation in patients with cardiac implantable electronic devices

Kazuo Miyazawa; Yusuke Kondo; Miyo Nakano; María Asunción Esteve‐Pastor; José Miguel Rivera‐Caravaca; Keitaro Senoo; Yoshio Kobayashi; Professor Gregory Lip

doi:10.1016/j.ejim.2018.02.019

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