Research progress of metrology of digital modulation error parameters

Digital modulation error parameters, such as error vector magnitude EVM, is important in test and measurement of information system. This paper introduces the technology research progress in the metrology of digital modulation error parameters. First, we point out the basic problems existing in the field, which is about traceability and parameter range of calibration, and describe the relevant research, such as the thinking and technology of the `RF waveform metrology'. Then, we highlight the research progress of our team: 1). The metrology method and system for digital demodulation error parameter based on CW combination, which fits BPSK, QPSK, 8PSK, 16QAM, 64QAM modulation: this method can achieve traceability and error setting ability in a wide range, when standard EvmRms is 1.585%, the expanded uncertainty (k=2) is 0.009%. 2). The metrology method and system for digital demodulation error parameter based on analog AM or PM. 3). The metrology method and system for digital demodulation error parameter based on IQ gain imbalance and phase imbalance. 4). The metrology method and system for digital demodulation error parameter based on analog PM in the aspect of GMSK and FSK modulation. 5). The metrology method and system for digital demodulation error parameter based on Baseband waveform design. Based on these methods, our proposal are given as follows: first, establish public metrology standard for digital modulation error parameters; second, develop a new type of instrument "vector signal analyzer calibrator".