Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

Mitsuo Suga; Shunsuke Asahina; Yusuke Sakuda; H. Kazumori; Hidetoshi Nishiyama; Takeshi Nokuo; Viveka Alfredsson; Tomas Kjellman; Sam M. Stevens; Hae Sung Cho; Minhyung Cho; Lu Han; Shunai Che; Michael W. Anderson; Ferdi Schüth; Hexiang Deng; Omar M Yaghi; Zheng Liu; Hu Young Jeong; Andreas Stein; Kazuyuki Sakamoto; Ryong Ryoo; Osamu Terasaki

doi:10.1016/j.progsolidstchem.2014.02.001

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