Random parameter variation in analog VLSI neural networks for linear image filtering

This paper introduces an analytic method to determine the sensitivity to random parameter variations of analog VLSI neural network architectures for linear image filtering. The authors compare the robustness of several different circuit architectures for low pass filtering. This method can also determine which components within a particular architecture should specified the most precisely.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>