A new approach for quantifying the elastic deformation behavior of one-dimensional nanostructures is presented by fitting the image profile measured using atomic force microscopy in contact mode along the entire length of a bridged/suspended nanobelt/nanowire/nanotube under different load forces. Consistently fitting the measured deformation profiles can uniquely determine if the measured data are best explained by either the clamped-clamped beam model or the free-free beam model without preassumption, and it eliminates the uncertainty in defining the central point of the suspended beam, thus, greatly increasing the precision and reliability of the measurements.
Discussion(0)
No comments yet. Be the first to comment.