A future scanning/transmission electron microscope is proposed to be a comprehensive machine that is capable of providing picoseconds time-resolved information at sub-nanometer scale and even at picometer scale, spatial resolution. At the same time, physical and chemical properties can be measured in situ from a region as small as a few nanometers by introducing local electric, mechanical, thermal, magnetic and/or optical stimulations/excitations under vacuum or even in a quasi-ambient environment. It is anticipated that nanoscopy and picoscopy will be key tools for studying picoscale science and developing nanoscale technology related to materials science, biology, physics and chemistry.
D. H. Lowndes, Paul Alivisatos, Mark Alper, R. S. Averback, J. Barhen, J. A. Eastman, Dylan M. Imre, D. H. Lowndes, Ian McNulty, Terry A. Michalské, KM Ho, Arthur J. Nozik, Thomas Russell, Ramsés Valentín, D. O. Welch, J. Barhen, Sean R. Agnew, Pascal Bellon, J. Pete Blair, L. A. Boatner, Yehuda Braiman, J. D. Budai, G. W. Crabtree, L. C. Feldman, C. P. Flynn, David B. Geohegan, E. P. GEORGE, Elias Greenbaum, Costas P. Grigoropoulos, T. E. Haynes, J. Heberlein, J. Hichman, O. W. Holland, S. Honda, Joanna Horton, Michael Z. Hu, D. E. Jesson, David C. Joy, A.R. Krauss, W. K. Kwok, B. C. Larson, DJ Larson, K. K. Likharev, C. T. Liu, A. Majumdar, P.J. Maziasz, A. Meldrum, Joel C. Miller, F. A. Modine, S. J. Pennycook, George M. Pharr, Simon R. Phillpot, D. L. Price, V. Protopopescu, D. B. Poker, David Y.H. Pui, J. Michael Ramsey, Nageswara S. V. Rao, L. E. Reichl, J. B. Roberto, M-L Saboungi, M. Simpson, S. Strieffer, Thomas Thundat, M. Wambsganss, J. Wendleken, C. W. White, Gerald Wilemski, S. P. Withrow, D. Wolf, Jinghan Zhu, R. A. Zuhr, Alex Zunger, Sandra Löwe
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