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Patent Counting and the 'Top-Down' Approach to Patent Valuations: An Economic and Public Policy Appraisal of Reasonable Royalties — David J Teece (2020) | RDL Network
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Patent Counting and the 'Top-Down' Approach to Patent Valuations: An Economic and Public Policy Appraisal of Reasonable Royalties
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David J Teece
University of California, Berkeley
Patent Counting and the 'Top-Down' Approach to Patent Valuations: An Economic and Public Policy Appraisal of Reasonable Royalties
Article
2020
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Authors
David J Teece
University of California, Berkeley
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