OFDR measurements of insertion and return losses of integrated optic devices
In: OFDR measurements of insertion and return losses of integrated optic devices
Chapter In A Book 1995 English
Authors
JW
Jean Pierre von der Weid
GM
Giorgio Mussi
JT
J. Troger
Abstract
1 min read
The insertion loss of an integrated optic device is measured by means of the OFDR teclmique. Measurements of Rayleigh BackScattered intensity in the input and output fibers of the device allow direct detection of light power guided in the fiber before and after the component. The insertion and return losses of the component can thus be directly evaluated. Experimental results are in good agreement with measurements performed by the cut-back method.
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