Light scattering spectroscopy is used as a non-invasive technique to characterize mineralization of silk films. Acquired scattering data is analyzed to provide information about the overall content as well as the organization of mineral deposits.
Chiara E. Ghezzi, Liqiang Wang, Irmgard Behlau, Jelena Rnjak‐Kovacina, Siran Wang, Michael H. Goldstein, Jingbo Liu, Jeffrey K. Marchant, Mark I. Rosenblatt, David Kaplan
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