The use of a combination of several measurement techniques to investigate the dielectric properties of 80 rock samples in the microwave region is discussed. The real part of the relative dielectric constant epsilon ' was measured in 0.1-GHz steps from 0.5 to 18 GHz, and the imaginary part epsilon " was measured at five frequencies extending between 1.6 and 16 GHz. In addition to the dielectric measurements, the bulk density was measured for all the samples and the bulk chemical composition was determined for 56 of the samples. This study shows that epsilon ' is frequency-independent over the range of 0.5-18 GHz for all rock samples, and that the bulk density rho /sub b/ accounts for about 50% of the observed variance of epsilon '. For silicate rocks, as much as 78% of the observed variance of epsilon ' may be explained by the combination of density and the fractional contents of various oxides determined by X-ray fluorescence when the silicates are subgrouped by genesis. In contrast, the loss factor epsilon " decrease with increasing frequency for most rock samples. It was not possible to establish statistically significant relationships between epsilon " and the measured density of the rock samples. However, in the case of silicate rocks, 60% of the variance in epsilon " generally can be explained by the bulk chemical composition when the silicates are subgrouped by genesis.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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