Mechanisms for Fatigue of Micron-Scale Silicon StructuralFilms

Related publications

Daan Hein Alsem, Olivier N. Pierron, Eric A. Stach, Christopher L. Muhlstein, Robert O. Ritchie

OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Daan Hein Alsem, Olivier N. Pierron, Eric A. Stach, Christopher L. Muhlstein, Robert O. Ritchie

Daan Hein Alsem, Olivier N. Pierron, Eric A. Stach, Christopher L. Muhlstein, Robert O. Ritchie

Lawrence Berkeley National Laboratory

D. H. Alsem, Olivier N. Pierron, E.A. Stach, Christopher L. Muhlstein, Robert O. Ritchie

Advanced Engineering Materials

Christopher L. Muhlstein, E.A. Stach, Robert O. Ritchie

Applied Physics Letters