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Measurements of Surface Residual Stresses in Si<sub>3</sub>N<sub>4</sub> Based Laminates by Raman Spectroscopy

Discussion(0)

Related publications

AIN-Based Ceramics - an Alternative to Si<sub>3</sub>N<sub>4</sub> and SiC in High-Temperature Applications?

Biogeochemical drivers of soil N<sub>2</sub>O, CH<sub>4</sub>, and CO<sub>2</sub> emissions from alfalfa using long-term continuous measurements

Novel Properties of (LiMo<sub>3</sub>Se<sub>3</sub>)<sub>n</sub>, a Polymeric Chevrel Cluster Compound: Thin Films of Macromolecular Wires Cast from Solution

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Measurements of Surface Residual Stresses in Si&lt;sub&gt;3&lt;/sub&gt;N&lt;sub&gt;4&lt;/sub&gt; Based Laminates by Raman Spectroscopy

Discussion(0)

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