Skip to content
RDL
Network
Ekosistem
Uygulama değiştir
EN
Hakkımızda
SSS
Giriş yap
Başla
Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies — Frank Welkenhuyzen (2009) | RDL Network
Back
Cite
Save
Save for later
Share
Home
Publications
Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies
Shared by
Jean-pierre Kruth
KU Leuven
Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies
Article
2009
English
Authors
+4 more
FW
Frank Welkenhuyzen
KK
Kim Kiekens
MP
Mieke Pierlet
Abstract
1 min read
No abstract is provided for this article.
Discussion
(0)
Sign in
to like and join the discussion.
No comments yet. Be the first to comment.
Related publications
Article
2015
Influence of Electron Beam Alignment on Dimensional Metrology by Computed Tomography
Gabriel Probst
,
Michele Pavan
,
Jitendra Singh Rathore
,
Tom Craeghs
,
Jean-pierre Kruth
,
Simone Carmignato
,
Wim Dewulf
Article
2012
Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications
Ye Tan
,
Kim Kiekens
,
Frank Welkenhuyzen
,
Jean-pierre Kruth
,
Wim Dewulf
Article
2007
Optical measurement techniques for mobile and large scale dimensional metrology
Wim Cuypers
,
Nick Van Gestel
,
André Voet
,
Jean-pierre Kruth
,
Philip Bleys
Article
2012
Simulation of X-ray projection images for dimensional CT metrology
Frank Welkenhuyzen
,
Bart Boeckmans
,
Jean-pierre Kruth
,
Wim Dewulf
,
André Voet
Article
2011
A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology
Kim Kiekens
,
Frank Welkenhuyzen
,
Ye Tan
,
Philip Bleys
,
André Voet
,
Jean-pierre Kruth
,
Wim Dewulf
Discussion(0)
No comments yet. Be the first to comment.