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Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies — Frank Welkenhuyzen (2009) | RDL Network
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Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies
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Jean-pierre Kruth
KU Leuven
Industrial computer tomography for dimensional metrology: Overview of influence factors and improvement strategies
Article
2009
English
Authors
+4 more
FW
Frank Welkenhuyzen
KK
Kim Kiekens
MP
Mieke Pierlet
Abstract
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