In-situ Raman measurement of an individual Silicon nanowire trapped using optoelectronic tweezers (OET)
Article 2007 en
Authors
AJ
Arash Jamshidi
PS
P. James Schuck
PP
Peter J. Pauzauskie
Abstract
1 min read
Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text A. Jamshidi, P. J. Schuck, P. J. Pauzauskie, A. T. Ohta, H. Hsu, J. Valley, P. Yang, and M. C. Wu, "In-situ Raman measurement of an individual Silicon nanowire trapped using optoelectronic tweezers (OET)," in Frontiers in Optics 2007/Laser Science XXIII/Organic Materials and Devices for Displays and Energy Conversion, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper FWP2. Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
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