Improved Circuit Design of BIST Based on STUMPS

Conventional STUMPS spends much time for testing,and its fault coverage is not high enough.To reduce the testing time,a modified structure which tests the CUT with Test-Per-Clock and test-vector compression is proposed.To improve the fault coverage,storage-mode is added to LFSR-mode.Experiments on ISCAS'85 benchmark circuits show that the scheme is satisfied.