Gauging aromatic conjugation and charge delocalization in the aryl silanes Ph<sub>n</sub>SiH<sub>4−n</sub> (<i>n</i> = 0–4), with silicon K-edge XAS and TDDFT — Nicholas A. Phillips (2020) | RDL Network
Gauging aromatic conjugation and charge delocalization in the aryl silanes Ph<sub>n</sub>SiH<sub>4−n</sub> (<i>n</i> = 0–4), with silicon K-edge XAS and TDDFT
Si K-edge X-ray absorption spectra (XAS) have been measured experimentally and calculated using time-dependent density functional theory (TDDFT) to investigate electronic structure in aryl silanes, Ph<sub>n</sub>SiH<sub>4−n</sub> (<italic>n</italic> = 0–4).
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