Fast, non-Monte-Carlo estimation of transient performance variation due to device mismatch

This paper describes a noise-based method of estimating the effects of device random mismatch on circuit's transient response, such as delay and frequency. The proposed method models DC mismatch as equivalent AC pseudo-noise and exploits the fast periodic noise analysis (PNOISE) available in RF circuit simulators to compute the resulting variation in the circuit response. While the method relies on Gaussian mismatch distributions and linear perturbation model, it can model and analyze correlations as well as identify the most sensitive design parameter to mismatches with no additional simulation cost. Three benchmarks measuring the variations in the input offset voltage of a comparator, the delay of a logic path, and the frequency of an oscillator demonstrate the speed improvement of 100--1000x compared to a 1000-point Monte-Carlo method.