Extended Focused Image in White Light Scanning Interference Microscopy

Hernando Altamar-Mercado; Alberto Patino Vanegas; Andrés G. Marrugo

doi:10.1364/isa.2019.ith1c.3

Authors

HA
Hernando Altamar-Mercado
Alberto Patino Vanegas
Universidad Tecnológica de Bolívar
AM
Andrés G. Marrugo

Abstract

1 min read

We propose a method to obtain a fringe-free extended focused image in white light scanning interference microscopy based on processing the stack of images over a range within the coherence length of the source.

Discussion(0)

No comments yet. Be the first to comment.

Related publications

Article2022

Optimal window selection for obtaining an extended-depth-of-focus image from white light interference microscopy images

Hernando Altamar-Mercado, Alberto Patino Vanegas, Andrés G. Marrugo

Article2018

Experimental investigation of white-light interferometry based on sub-dark-field illumination

ChunKan Tao, Yujing Wu, WeiYi Wang, Yunsheng Qian, Rui Tao, Tianyou Kang

Optics Communications

Article2018

Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy

Hernando Altamar-Mercado, Alberto Patino Vanegas, Andrés G. Marrugo

Applied Optics

Article2017

Application of white-light phase-shifting in white-light scanning interferometry

ChunKan Tao, Wang Wei-yi, Yijun Zhang, Yujing Wu, Yunsheng Qian

Article2025

Multi-channel Glow network pre-trained on white-balance dataset for underwater image enhancement

Shunsuke Takao, Kenji Watanabe, Takumi Kobayashi